JPH02128508U - - Google Patents

Info

Publication number
JPH02128508U
JPH02128508U JP3465589U JP3465589U JPH02128508U JP H02128508 U JPH02128508 U JP H02128508U JP 3465589 U JP3465589 U JP 3465589U JP 3465589 U JP3465589 U JP 3465589U JP H02128508 U JPH02128508 U JP H02128508U
Authority
JP
Japan
Prior art keywords
film thickness
light source
measuring device
light receiving
meter body
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Pending
Application number
JP3465589U
Other languages
English (en)
Japanese (ja)
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed filed Critical
Priority to JP3465589U priority Critical patent/JPH02128508U/ja
Publication of JPH02128508U publication Critical patent/JPH02128508U/ja
Pending legal-status Critical Current

Links

Landscapes

  • Length Measuring Devices By Optical Means (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)
JP3465589U 1989-03-27 1989-03-27 Pending JPH02128508U (en])

Priority Applications (1)

Application Number Priority Date Filing Date Title
JP3465589U JPH02128508U (en]) 1989-03-27 1989-03-27

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
JP3465589U JPH02128508U (en]) 1989-03-27 1989-03-27

Publications (1)

Publication Number Publication Date
JPH02128508U true JPH02128508U (en]) 1990-10-23

Family

ID=31539322

Family Applications (1)

Application Number Title Priority Date Filing Date
JP3465589U Pending JPH02128508U (en]) 1989-03-27 1989-03-27

Country Status (1)

Country Link
JP (1) JPH02128508U (en])

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015163299A1 (ja) * 2014-04-22 2015-10-29 株式会社アドバンテスト 電磁波測定装置、測定方法、プログラム、記録媒体

Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6125082A (ja) * 1984-07-13 1986-02-03 Nec Corp 新方向探知システム

Patent Citations (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS6125082A (ja) * 1984-07-13 1986-02-03 Nec Corp 新方向探知システム

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2015163299A1 (ja) * 2014-04-22 2015-10-29 株式会社アドバンテスト 電磁波測定装置、測定方法、プログラム、記録媒体
JPWO2015163299A1 (ja) * 2014-04-22 2017-04-20 株式会社アドバンテスト 電磁波測定装置、測定方法、プログラム、記録媒体

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